Test Systems

Measure all parameters of the FETs on the module such as

• Contact check
• VSD diode
• BVDSS
• IDSS and DIDSS (forward/reverse) with leakage current compensation
• IGSS / DIGSS
• VGSTH
• RDSON
• ZTH, ZTH loop
• C-Capacitor
• R-Resistor, R-Shunt

Integrated avalanche tests (avalanche test with VBAT max. 90 VDC). Integration into a fully automated handling system.

Measure all parameters of the IGBT’s on the module (up to 1000A) such as

• Contact
• VSD diode
• VCE, VCESAT
• ICES / DICES (forward/reverse) with leakage current compensation
• IGES / DIGES
• VGSTH
• ZTH, ZTH loop
• C-Capacitor
• R-Resistor, R-Shunt

Integration into a fully automated handling system.

Control of the measurement unit and accurate data logging with the highest possible resolution. Including external oscilloscopes for analyzing the measuring results like: du / dt value, di / dt value, switching times, clamping voltage, peak voltages, collector current, gate voltage.
Complete traceability of each DUT for later analysis saving the measuring data in databases with upload to the company network if necessary.

Measurement unit up to 1500 V / 4000 A RBSOA and 1500 V / 12000 A SCSOA.

• Measuring equipment adapted for each product to get the highest possible resolution.
• Customized DC link for each DUT to minimize ESL.
• Individual gatedrive stage.
• Contact check unit to ensure the DUT is properly connected before applying high voltage.
• Short circuit detection option to prevent uncontrolled discharging of the DC link into the system during a DUT failure.
• Very low stray induction of the complete system otherwise it will be just switching without real stressing during switching.
• Integrated into a fully automated shift-operation production line.

A very compact test system for carrying out High Temperature Reverse Bias tests, which is capable to test 4x DUTs with up to +/- 6500 V at max. 200 °C.

• The test system works for 72 hours independently of the PC (in case of PCshutdown)
• High voltage power supplies
• A standard meter to monitor the current and voltage
• 4x temperature regulators
• Separate heating and cooling for each DUT

Low volume production line ZTH test system with 150 A. Testing all parameters of a FETmodule such as:

• Contact check
• VSD diode
• BVDSS
• IDSS and DIDSS (forward / reverse) with leakage current compensation
• IGSS / DIGSS
• VGSTH
• RDSON
• ZTH, ZTH loop
• C-Capacitor
• R-Resistor, R-Shunt

The DUTs are cycled for a specific time (100 h - 1000 h), most of the time under high temperature in a heating chamber. Different JEDEC standards define the individual test for each DUT which is interpreted by the hardware and software. The complete test is interpreted by analysis tools.

• High power supplies and a standard oscilloscope to monitor the current and voltage
• Multiplexer to switch each DUT to the scope for V-measurement
• Current-limitation for each DUT
• Separate contacting for the 80 DUTs placed into a heating chamber up to 260 °C

Rectifier diodes (DUTs) are stresstested with high-current pulses (up to 200 A) while monitoring forward voltage to determine internal temperature. Afterwards the rectifier diode is cooled down to a given
forward voltage start value and repeats the test. Each of the 16 independent test positions runs for over 500 hours with programmable cycles and cooling phases.

• Custom voltage and current classification per customer specs
• Programmable cycle patterns
• Independent test positions for parallel testing

For calibration, this module is simply measured using a suitable reference instrument. The result is then transmitted to the tester and stored in non-volatile memory — completely eliminating the need for manual adjustment using potentiometers.

To simplify the process, we provide a dedicated tool for automatic calibration. This tool works in conjunction with a calibrated digital multimeter and additional circuitry to cover all relevant measurement ranges.

Especially for our international customers, this solution enables independent calibration and periodic verification of the tester’s DC specifications. A detailed calibration report is generated automatically, comparing the values from the tester and the reference multimeter.